LIU, Shugang; SHI, Shang; WU, Jie. Surface defect detection algorithm for special-shaped electronic components based on improved RT-DETR. Computer Life, [S. l.], v. 13, n. 2, p. 48–51, 2025. DOI: 10.54097/q2xhcb58. Disponível em: http://computer-life.org/index.php/ojs/article/view/18. Acesso em: 2 may. 2026.